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Impacts on Chips: Growth Drivers

Impacts on Chips: Growth Drivers

Author: John Dinsdale, Jim McGregor, Michelle Abraham, Norm Bogen, In-Stat
19-Jan-0912561257
Implant Metrology for Bonded SOI Wafers Using a Surface Photo-Voltage Technique

Implant Metrology for Bonded SOI Wafers Using a Surface Photo-Voltage Technique

Author: Adam Bertuch, Wesley Smith, Ken Steeples, Robert Standley, Anca Stefanescu, and Ron Johnson
17-Aug-0715001504
Map the Supply Chain

Implementing a Conflict - free Supply Chain: Intel’s Experience

Author: Carolyn Duran PhD
18-Jul-1583175
SOC

Implementing an Intelligent SOC - Security Operations Center

Author: Paul Stamp
12-Mar-1313501790
Implementing Analysis, Implementing Editing, Offline Applications for iOS, Free publish electronics

Implementing Analysis Editing and Offline Applications for iOS

Author: Divesh Goyal, Mark Dostal
25-Oct-1311901718
Importance of Spectrum Harmonization on Mobile Broadband

Importance of Spectrum Harmonization on Mobile Broadband

Author: Wladimir Bocquet
11-Sep-0933243844
Important Features of Doctrine Framework

Important Features of Doctrine Framework

Author: Pauline Taylor
21-Dec-1212431472
SSD Performance, Ultra Capacitor, UPS Power Backup, IT, Electronic Presentation upload Free

IMPROVE SSD PERFORMANCE WITH ULTRA CAPACITOR POWER BACKUP

Author: Jens Keiser, Dave Wright
01-Jul-1421542220
Stochastic Imaging Properties

Improved Stochastic Imaging Properties using PSM for EUVL

Author: Jung Sik Kim, Seongchul Hong, Jae Uk Lee, Seung Min Lee, Jinho Ahn
02-Nov-149201168
Improving Computer Algebra Systems

Improving Computer Algebra Systems

Author: Djordje Kadijevich
08-Jun-0919882002
IMS Sector Overview and Power Applications

IMS Sector Overview and Power Applications

Author: Carmelo Papa
16-Jul-0934213537
Client  Security Capabilities

In-Depth Look at Intel’s Business Client Security Capabilities

Author: Hormuzd Khosravi, Abhilasha Bhargav-Spantzel
02-Oct-1412891422
In-Memory Low Latency Analytics

In-Memory Low Latency Analytics: Opportunities and Architecture Trends

Author: K. Doshi, Jairam Ranganathan
20-Apr-157731143
In-Situ 4000 White Paper: Solving the problems of pyrometry and thickness measurement during MBE and

In-Situ 4000 White Paper: Solving the problems of pyrometry and thickness measurement during MBE and

Author: SVT Associates
11-Oct-0713071321
In-Situ Cleaning of Sn EUV Sources

In-Situ Cleaning of Sn EUV Sources

Author: Daniel Elg, Shailendra Srivastava, Ivan Shchelkanov, David N. Ruzic
29-Sep-1417122173
In-situ metrology for MOCVD

In-situ metrology for MOCVD

Author: Tom Thieme
12-Oct-14677921
Center of Physics, University of Minho, Semiconductor Quantum Dots, Great Potential for Solid-State

InAs GaAs Quantum Dot Site Control By Local Oxidation Nanolithography

Author: J. Martín-Sánchez
28-Oct-1014801480
Incorporating privacy into security standardization

Incorporating privacy into security standardization

Author: Claire Vishik, Intel UK
06-Feb-0917211725
Increased Serial NOR Performance  Enables New Applications, Micron Technology, Inc. DRAM, NAND Flash

Increased Serial NOR Performance Enables New Applications

Author: Cliff Zitlaw
08-Jul-139741015
NXP Semiconductors, Increasing energy efficiency, semiconductors to enable energy savings

Increasing energy efficiency with semiconductors to enable energy savings and create more comfort

Author: René Penning de Vries
26-Jul-1314282327
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