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Impact of IT: In Loss Reduction Impact of IT: In Loss Reduction
Author: K.B. Singh
23-May-126901368
Impacts of Nanotechnology and Manufactured Nanomaterials Impacts of Nanotechnology and Manufactured Nanomaterials
Author: Prof. Babajide Alo
09-Feb-1026742690
Impacts on Chips: Growth Drivers Impacts on Chips: Growth Drivers
Author: John Dinsdale, Jim McGregor, Michelle Abraham, Norm Bogen, In-Stat
19-Jan-0911441148
Implant Metrology for Bonded SOI Wafers Using a Surface Photo-Voltage Technique Implant Metrology for Bonded SOI Wafers Using a Surface Photo-Voltage Technique
Author: Adam Bertuch, Wesley Smith, Ken Steeples, Robert Standley, Anca Stefanescu, and Ron Johnson
17-Aug-0713721378
SOC Implementing an Intelligent SOC - Security Operations Center
Author: Paul Stamp
12-Mar-1310661451
Implementing Analysis, Implementing Editing, Offline Applications for iOS, Free publish electronics Implementing Analysis Editing and Offline Applications for iOS
Author: Divesh Goyal, Mark Dostal
25-Oct-138661399
Importance of Spectrum Harmonization on Mobile Broadband Importance of Spectrum Harmonization on Mobile Broadband
Author: Wladimir Bocquet
11-Sep-0929763447
Important Features of Doctrine Framework Important Features of Doctrine Framework
Author: Pauline Taylor
21-Dec-129151149
SSD Performance, Ultra Capacitor, UPS Power Backup, IT, Electronic Presentation upload Free IMPROVE SSD PERFORMANCE WITH ULTRA CAPACITOR POWER BACKUP
Author: Jens Keiser, Dave Wright
01-Jul-1417231797
Improving Computer Algebra Systems Improving Computer Algebra Systems
Author: Djordje Kadijevich
08-Jun-0917931806
IMS Sector Overview and Power Applications IMS Sector Overview and Power Applications
Author: Carmelo Papa
16-Jul-0932493361
Client  Security Capabilities In-Depth Look at Intel’s Business Client Security Capabilities
Author: Hormuzd Khosravi, Abhilasha Bhargav-Spantzel
02-Oct-1410051148
In-Situ 4000 White Paper: Solving the problems of pyrometry and thickness measurement during MBE and In-Situ 4000 White Paper: Solving the problems of pyrometry and thickness measurement during MBE and
Author: SVT Associates
11-Oct-0711991209
In-Situ Cleaning of Sn EUV Sources In-Situ Cleaning of Sn EUV Sources
Author: Daniel Elg, Shailendra Srivastava, Ivan Shchelkanov, David N. Ruzic
29-Sep-1412501583
In-situ metrology for MOCVD In-situ metrology for MOCVD
Author: Tom Thieme
12-Oct-14251482
Center of Physics, University of Minho, Semiconductor Quantum Dots, Great Potential for Solid-State InAs GaAs Quantum Dot Site Control By Local Oxidation Nanolithography
Author: J. Martín-Sánchez
28-Oct-1012321231
Incorporating privacy into security standardization Incorporating privacy into security standardization
Author: Claire Vishik, Intel UK
06-Feb-0914521460
Increased Serial NOR Performance  Enables New Applications, Micron Technology, Inc. DRAM, NAND Flash Increased Serial NOR Performance Enables New Applications
Author: Cliff Zitlaw
08-Jul-13770815
NXP Semiconductors, Increasing energy efficiency, semiconductors to enable energy savings Increasing energy efficiency with semiconductors to enable energy savings and create more comfort
Author: René Penning de Vries
26-Jul-139621867
NAND Flash, Refresh Iechniques, Increasing Endurance, Publish Electronic Presentations Increasing NAND Flash Endurance Using Refresh Techniques
Author: Yu Cai, Gulay Yalcin, Onur Mutlu, Erich F. Haratsch, Adrian Cristal, Osman S. Unsal, Ken Mai
26-Apr-145991368
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