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Environmentally Sound Data Destruction Environmentally Sound Data Destruction
Author: Christopher Danzig
09-Jun-0910411044
SECURE ERASE in NANDBased SSDs Erasing NAND-Based SSDs Securely
Author: Jon Tanguy
19-Jan-126581478
High Tech Results from AMR Research, ERP B2B Study High Tech Related Results ERP B2B Study High Tech Related Results
Author: Mark Morley
08-Aug-1310511386
ERP Implementation Costs of Restructuring the Business Model ERP Implementation Costs of Restructuring the Business Model
Author: Koji Matsumoto
08-Sep-1115151753
ERP Integration for High Tech, ERP Software for Electronics, ERP Software for High Tech ERP Integration for High Tech
Author: Mark Morley
06-Jun-136911196
Enterprise Security eSecurity to Go: Securing Next Generation Networks
Author: Tom Ruffolo, Kevin Forrest, and Tyler Carter
02-Feb-127843311
Essential Magnetic Recording Technology Trends Essential Magnetic Recording Technology Trends
Author: Gimcheolgi
30-Mar-128392118
Essential Points to Consider Before Disavowing Links: Essential Points to Consider Before Disavowing Links:
Author: Smartkathy
11-Jan-13634802
Estimation of Variability from Processes with Nested Structure Estimation of Variability from Processes with Nested Structure
Author: Diane K. Michelson
20-Sep-10668670
Stellaris MCUs Ethernet Applications and StellarisWare
Author: Texas Instruments
06-Jan-1113821488
Ethernet Layer 2/3/4 Market Ethernet Layer 2/3/4 Market
Author: Canalys
22-Jul-1112111372
Ethernet Switch Market Ethernet Switch Market
Author: Canalys
11-Jul-1114771625
Ethical Governance in Biometrics Ethical Governance in Biometrics
Author: ZHAI Xiaomei Ph.D
18-Jun-1012221225
Hacking Case Studies Ethical Hacking and Countermeasures: Case Studies
Author: EC-Council
02-Aug-1027712771
Ethical Hacking Ethical Hacking and Countermeasures: Physical Security
Author: EC-Council
30-Jul-1011981198
Ethics of Image Manipulation and Current Tools for Screening of Images: A Call for Standards Ethics of Image Manipulation and Current Tools for Screening of Images: A Call for Standards
Author: Chris Everett, Digital Art Team Leader, Cadmus Communication
26-Aug-0812171298
Europe’s Nanoelectronics Industry Europe’s Nanoelectronics Industry
Author: Marcel Annegarn
23-Oct-0911881207
EUV Mask Technology Defectivity Durability Inspection and Readiness EUV Mask Technology Defectivity Durability Inspection and Readiness
Author: Franklin Kalk
04-Sep-129211846
EUV: Remaining challenges to HVM Introduction EUV: Remaining challenges to HVM Introduction
Author: Stefan Wurm
15-Nov-129741675
EUVL: From Validation to Introduction EUVL: From Validation to Introduction
Author: Hans Meiling
11-Sep-1211112813
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