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Test Economics Driving Test Technology, Electronics

Test Economics Driving Test Technology Test Economics Driving Test Technology

This was Semiconductor Wafer Test Workshop (SWTW) keynote presentation. I covers VLSI's forecast, probe card market and observations about test economics and technology.

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Probe Cards

 
Author: Risto Puhakka (Fellow) | Visits: 1443 | Page Views: 1449
Domain:  High Tech Category: Semiconductors Subcategory: Test 
Upload Date: 8th-Jun-2009  

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Short URL: http://electronics.wesrch.com/pdfEL1SE1ZTZAAXK




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