Description: Paper covers: MOS Devices and Circuits. Sources & Types of Variations. scaling.
Line Edge Roughness (LER). Discrete doping. Discrete oxide thickness.
R and V body distributions. Self-heating. Hot spots.
IR drops. Layout Dependent Systematic Variations. Design rules effect on Performance.
Reliability & Yield. RDF: Random Dopant Fluctuations. HCI: Hot Carrier Stress.
Electromigration. Transient Faults. RTS and Digital Circuits.