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Reliability in the More than Moore Landscape, Electronics

Reliability in the More than Moore Landscape

Reliability in the More than Moore Landscape

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MEMS Reliability

Description: Paper about Reliability in the More than More Landscape, NXP Semiconductors, An R&D powerhouse, NXP Process Technology Research, Society Trends, Intelligent systems: Moore’s Law and Morethan-Moore combined, Sensor and Actuators technologies will move along More than Moore Arrow, Evolution in assembly & packaging, Increased technology integration poses new reliability challenges, Product reliability trend, Acceleration in typical product reliability tests, Classical Failures of Semiconductor.

 
Author: John Schmitz (Fellow) | Visits: 1852 | Page Views: 1870
Domain:  High Tech Category: Semiconductors Subcategory: MEMs 
Upload Date: 2010-07-27 03:34:20  
Short URL: http://electronics.wesrch.com/pdfEL1SE1EZDDMSE

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