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Reliability in the More than Moore Landscape, Electronics

Reliability in the More than Moore Landscape

Reliability in the More than Moore Landscape

Paper about Reliability in the More than More Landscape, NXP Semiconductors, An R&D powerhouse, NXP Process Technology Research, Society Trends, Intelligent systems: Moore’s Law and Morethan-Moore combined, Sensor and Actuators technologies will move along More than Moore Arrow, Evolution in assembly & packaging, Increased technology integration poses new reliability challenges, Product reliability trend, Acceleration in typical product reliability tests, Classical Failures of Semiconductor.

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MEMS Reliability

 
Author: John Schmitz (Fellow) | Visits: 1793 | Page Views: 1811
Domain:  High Tech Category: Semiconductors Subcategory: MEMs 
Upload Date: 2010-07-27 03:34:20  
Short URL: http://electronics.wesrch.com/pdfEL1SE1EZDDMSE

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