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    Fraunhofer to evaluate semicon wafer inspection tool - Imaging and Machine Vision Europe The Fraunhofer Institute for Photonic Microsystems (IPMS) and South Korean semiconductor equipment manufacturer Nex... More | Save |  Share  Email
    An Overview On The Proposed Amendments To The Legal Metrology Act, 2009 - Mondaq News Alerts (registration) Presently, the Legal Metrology Act, 2009 ("Act") and the Rules mentioned therein are t... More | Save |  Share  Email
    Nova Measuring Instruments to Present at the Stifel Technology, Internet and ... - MarketWatch Nova Measuring Instruments Ltd. (Nasdaq: NVMI), a leading innovator and a key provider of optical metrology s... More | Save |  Share  Email
    No ImageSnapchat Discover curates the news you want to read into one handy post - Digital Trends Fast Company Although most people think of Snapchat as a frivolous snap-post-erase app for teens, it's evolved i... More | Save |  Share  Email
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